What is TOF-SIMS? What is secondary ion time-of-flight mass spectrometry (ToF-SIMS) Secondary ion time-of-flight mass spectrometry (ToF-SIMS) is an extremely sensitive surface analysis method that uses a pulsed ion bea... Advanced Materials
The separation and diffusion in polycrystalline materials (NanoSIMS) The NanoSIMS method is used here to contribute to the understanding of the separation and diffusion of elements in polycrystalline materials. The strategy is to use stable isotope marker 18O to create... Advanced Materials
Study of phase separation processes (APT) Thanks to its unique spatial resolution analysis capability (lateral resolution and sub-nanometer depth), the CAMECA atom probe performs quantitative analysis at a standard atomic scale in materials. ... Advanced Materials
CIGS thin film solar cells (SIMS) Photovoltaic (PV) devices based on the Cu(In,Ga)Se₂(CIGS) absorber layer are among the most promising types of thin-film solar cells. The addition of alkali elements to the CIGS material, particularly... Advanced Materials
Types of materials for energy and catalysis (SIMS) Copper(I) oxide (Cu₂O), a p-type semiconductor, has long been regarded as a promising material for solar energy conversion and photocatalysis at low cost. Doping nitrogen into Cu₂O is an important res... Advanced Materials
Controlling purity in PV Si materials (SIMS) The production of silicon-based solar panel equipment using photovoltaic (PV) silicon material is upgraded to metallurgical grade with a purity of at least 6N. Quality control of the silicon refining ... Advanced Materials
Dopant monitoring in LED devices (SIMS) Optimizing doping (Mg, Si, Zn,...) and minimizing contamination (H, C, O, metals) is essential for high-performance LED devices. Using dynamic SIMS, it can record depth profiles of up to several micro... Advanced Materials
Mechanism of nuclear glass transformation (SIMS) The long-term behavior of glass types used to contain nuclear waste is a top concern to ensure safe geological disposal. To understand the mechanisms of glass alteration, it is important to study the ... Semiconductor
Helium migration in nuclear reactors (SIMS) In nuclear reactors, the movement and retention of helium can lead to blistering, hardening, and breakage due to severe embrittlement, blistering... To ensure the longevity of structural nuclear mater... Semiconductor
Interdiffusion of U and Zr between nuclear fuel and cladding (EPMA) The international VERDON-ISTP program aims to research and mitigate the risk of radioactive product emissions into the environment in the event of a severe nuclear accident. Among these, some experime... Advanced Materials
Deep and shallow implant depth analysis (SIMS) In semiconductor technology, materials and thus analytical issues are changing rapidly. Thanks to its superior depth analysis capability, the CAMECA IMS 7f-Auto is widely used to monitor dopants in th... Semiconductor
Contamination control (SIMS) Controlling impurities by SIMS – High-performance trace analysis for light elements Conventional microanalysis techniques such as Glow Discharge Mass Spectrometry (Glow Discharge Mass Spectrometry - G... Semiconductor
