Asbestos Fibre Detection and Quantification Using TT SEM + EDS “Asbestos” is not a single chemical entity but rather the name of a group of six naturally occurring hydrated fibrous polysilicates that include small and ultrafine fibers. Previously, asbestos was pr... Bomedical
What is the difference between SPECTROMETRY and SPECTROSCOPY? Scientific terms are often used interchangeably, and scientifically accepted descriptions are continuously refined and reinterpreted, which can lead to misunderstandings in scientific knowledge. While... Advanced Materials Quantum Semiconductor
What is a non-metallic clean room? GENERAL DESCRIPTION It is a non-metal clean room used for the analysis of trace elements, radioactive isotopes using devices such as ICP-MS for the analysis of U, Th isotopes and trace elements in bio... Advanced Materials Semiconductor
History of AFM suppliers Tracking atomic force microscope (AFM) suppliers over the past few years has become difficult due to several mergers and acquisitions. At the last count, there were at least 26 AFM companies since the... Advanced Materials Semiconductor
How to prepare samples for electron microscopy? Notes when we prepare samples for the SEM: When using the SEM microscope, we must absolutely comply with the requirements for samples and vacuum based on the following principles: Samples must be as c... Bomedical
Accelerated MICRO CT "SYNCHROTRON" imaging technique X-Tomography Synchrotron Computed tomography with X-rays (CT) is a non-destructive technique to display the internal characteristics of solid objects and to obtain digital information about their geom... Semiconductor
X-Ray Computed Tomography (CT) What is X-Ray Computed Tomography (CT)? X-Ray Computed Tomography (CT) is a non-destructive technique used to display the internal features of solid objects and to obtain digital information about the... Bomedical
Introducing Nu Sil Introduction - Online Webinar about Nu Sil Nu Sil is a new sample preparation system recently launched by Nu Instruments, designed for high-precision analysis of silicon isotopes in silica (silicon di... Isotope & Radication
Mass photometry - A new method for determining the size of biomolecules How does it work? The mass photometry method is based on the principles of reflective interference microscopy and scattering interference microscopy. Through carefully controlled illumination, Profess... Bomedical
Measuring ultra-shallow implants (EXLIE SIMS) The production of the latest semiconductor chips and the continued miniaturization of CMOS components are pushing the limits of junction depth (junction depth) below 10nm, with profile steepness (prof... Advanced Materials Semiconductor
Promote the development of super durable aluminum alloys for the production of additives Although it has attractive properties such as low density, high strength, and corrosion resistance, aluminum alloys are applied more slowly in additive manufacturing (AM) compared to steel, titanium a... Advanced Materials
Atomic scale characteristics of the derivative (APT) As transistor structures continue to shrink to keep pace with Moore's Law the existing analysis and metrology techniques currently in use will no longer be sufficient to fully characterize the nanosc... Semiconductor
