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Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS)
Collision Cell Multi-Collector ICP-MS Sapphire

Sapphire is a Multi-Collector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS) system featuring a proprietary dual-path technology, integrating a collision/reaction cell to thoroughly eliminate spectral interferences from the argon source. The instrument possesses two distinct ion paths: a high-energy path (6 kV) for traditional isotope analyses, and a low-energy path (4 kV) routed through the reaction hexapole. It stands as an ideal solution for analyses in geochemistry, cosmochemistry, and life sciences

Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS)
High Resolution Multi-Collector ICP-MS Plasma 1700

Nu Plasma 1700 is a multi-collector mass spectrometry system (MC-ICP-MS) designed for large mass dispersion (mass dispersion ~1700 mm). The device can achieve a resolution of >30,000, while at levels >5,000 it still maintains a flat-top peak, preserving almost absolute sensitivity. Each detector is equipped with independently adjustable slits. An optimal solution in geochemistry, cosmochemistry, and life sciences.

X-ray Diffraction (XRD)
Horizontal electron diffractometer ELDICO ED-1

As the world's first dedicated horizontal electron diffraction machine, the ELDICO ED-1 combines a 160 keV beam source and a DECTRIS QUADRO detector. The device achieves a resolution of <0.84 Å, enabling rapid decoding of nano crystal structures (10–1000 nm). This is the optimal cost-effective solution for pharmaceutical research, battery materials, and agricultural chemicals.

Raman Microscopy
Alpha300 access Confocal Microscope

Alpha300 access is a Raman system designed as an ideal starting point for WITec's Raman imaging technology in budget-constrained environments. Even in the entry segment, the system still provides high-performance Raman mapping, superior spectral quality thanks to the UHTS spectrometer, precise optical components, and in-depth knowledge of Raman. It can be upgraded to more powerful configurations of the alpha300 R line later.

Physical Vapor Deposition (PVD)
Thin Film Deposition System AXXIS
AXXIS is a versatile PVD thin film deposition system designed for research and development (R&D) activities that require various coating techniques on the same equipment. The system allows for the combination of Magnetron sputtering, thermal evaporation, and electron beam evaporation while supporting co-deposition to create multi-component films or complex alloys.
Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICPMS-TOF)
Time-of-Flight ICP-MS Vitesse

Vitesse is an Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICP-TOF-MS) system, specifically designed for high-speed multi-element applications such as laser ablation imaging and nanoparticle analysis. It features a segmented reaction cell and powerful interference removal capabilities, making it an ideal solution for geochemical, biological, environmental, and materials research.

Thermal Ionization Mass Spectrometry (TIMS)
Thermal Ionisation Mass Spectrometry TIMS

Nu TIMS is a thermal ionization mass spectrometry system developed based on variable dispersion multi-collector technology. Nu TIMS achieves peak accuracy with a mass range of 5–300 amu, outstanding sensitivity, and fully automated operation. An optimal solution for U-Pb geochronology, radioactive isotope analysis (Sr, Nd, Pb) and nuclear, environmental, and cosmochemical applications.

Raman Microscopy
Alpha300 R Confocal Raman Microscope

The Alpha300 R is a confocal Raman microscope that meets various requirements – from micro-Raman mapping to high-speed 3D imaging. The Fast Raman Imaging™ technology with motorized capabilities allows for image acquisition at superior speeds. It can be upgraded to integrate AFM, SNOM, TERS, and other correlative modes, suitable for all fields from materials science, geology, to biology and pharmaceuticals.

Physical Vapor Deposition (PVD)
Thin Film Deposition System PRO Line PVD 200

The PRO Line PVD 200 system elevates research productivity with its capability to process large wafers up to 8 inches. The system serves as a perfect solution to shorten your experimental turnaround time, delivering absolutely uniform thin-film deposition for future industrial applications.

High-Resolution Ultra-Trace Analysis
X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA

SPECS' EnviroESCA is an electron spectroscopy system for chemical analysis in real-world environmental conditions thanks to breakthrough (N)AP-XPS technology. The device operates at pressures of up to hundreds of mbar, integrating a micro-focused AlKalpha monochromatic X-ray source and Environmental Charge Compensation to automatically neutralize background charging. EnviroESCA minimizes the time from loading to measuring samples, ideal for research on biological materials, polymers, batteries, catalysts, and liquids.

Secondary Ion Mass Spectrometry (SIMS)
Secondary ion mass spectrometry 1300-HR³

Is the generation of large configuration secondary ion mass spectrometers (LG-SIMS) the most advanced from CAMECA, a device that provides sensitivity and spatial resolution - mass at an absolute level. This is the optimal cost-effective analytical solution for geochemical research, trace element measurement, mineral dating, and analysis of micro-particles for nuclear safety control.

3D X-ray Microscopy (XRM)
XRF Microscope AttoMap-200
MicroXRF laboratory achieves the highest resolution with a micron-sized unit (3-5 µm) using high-resolution optics. Sensitivity below ppm for quantification down to parts per million (ppm). Along with Sigray's flexible software packages for energy tuning, maximizing throughput and sensitivity with up to 5 different angled X-ray spectra.  
Physical Vapor Deposition (PVD)
Thin Film Deposition System PRO Line PVD 75
The new generation PRO Line PVD 75 thin film deposition system with the capability to handle samples up to 6 inches. The device optimizes ideal base pressure, increases vacuum pumping speed, and supports multiple techniques (Sputtering, E-beam, Thermal). This is a flexible, reliable R&D solution for semiconductor, OLED, and optical technology.
Secondary Ion Mass Spectrometry (SIMS)
SIMS 7f-Auto Secondary Ion Mass Spectrometer

Equipped with dual magnetic convergence SIMS technology, the IMS 7f-Auto secondary ion mass spectrometer provides excellent depth resolution with a detection limit of ppb. This is a fully automated analytical solution that delivers high throughput for the semiconductor, optoelectronics, and materials industries, maximizing productivity with continuous operation 24/7.

X-ray Absorption Spectroscopy (XAS)
X-ray Absorption Spectroscopy (XAS) QuantumLeap-H2000

QuantumLeap is an advanced X-ray Absorption Spectroscopy (XAS) system featuring dual transmission and fluorescence modes. The system offers a wide energy range from 4.5 to 25 keV and stands as the only laboratory-scale XAS that delivers synchrotron-equivalent performance directly to your lab, providing solutions for batteries and solar cells, catalysis, and heavy element research.

Secondary Ion Mass Spectrometry (SIMS)
Secondary Ion Mass Spectrometry (SIMS) - ACTINIS

Developed from the renowned IMS 7f platform, the secondary ion mass spectrometry (SIMS) with ACTINIS casing features an advanced radiation protection system, allowing for the measurement of radioactive samples up to 2 Gy/h. The device achieves sub-micron spatial resolution, optimizing transmission and the ability to measure isotope ratios. This is a safe automation solution, ideal for optimizing the nuclear fuel cycle and waste management.

Secondary Ion Mass Spectrometry (SIMS)
NanoSIMS 50L
It is an advanced secondary ion mass spectrometer (SIMS), NanoSIMS 50L featuring a proprietary co-axial optical design. The device analyzes isotopes and trace elements at a resolution of <50 nm, ppm sensitivity with parallel acquisition speed. This is a superior analytical solution dedicated to research in geology, cell biology and materials science.
X-ray Absorption Spectroscopy (XAS)
X-ray absorption spectroscopy (XAS) QuantumLeap-V210

The first XAS system capable of analyzing low atomic number samples and micro-point analysis. Allows XANES measurements at 0.7 eV and EXAFS within seconds or minutes. MicroXAS with a spot size of 100 microns with an automated sample stage allows XAS mapping at a resolution of 100 µm on a sample. It is the leading solution for battery research, catalysis, and materials science.

Secondary Ion Mass Spectrometry (SIMS)
IMS 7f-GEO

Is a secondary ion mass spectrometer IMS 7f-GEO specialized from CAMECA, integrating a dual detector (FC/FC) and Electron Multiplier. The device offers an ultra-fast peak switching speed of 0.3s, reducing measurement time from >3000s to 56s. This is the optimal High-throughput solution for analyzing stable isotopes and rare earth elements (REE) in geochemistry.

3D X-ray Microscopy (XRM)
TriLambda-30 X-ray Microscope

TriLambdaXRM-30 (nanoXRM) utilizes Sigray's proprietary X-ray optics technology to provide cutting-edge resolution of 35nm. The device integrates up to 3 X-ray energy sources simultaneously to optimize the 3D nanoXRM image contrast for all types of materials from polymers to metals, providing a perfect non-destructive sample solution for batteries and biology.

Micro & Nano Imaging
FE - LEEM/PEEM P90 AC

SPECS FE-LEEM/PEEM P90 Series is a next-generation surface electron microscope system, combining a breakthrough between LEEM and PEEM techniques in a minimalist, ultra-stable modular design. Equipped with a Cold Field Emission Gun and an integrated energy filter, the system provides micro-spectral analysis capabilities and displays thin film structure images with superior spatial resolution below 2nm. This is the optimal analytical solution for in situ surface kinetics studies in situ, advanced materials science, and nanotechnology

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