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25 items found.

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Method & Application
Measurement & Error Analysis - 25 items

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RESET

Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro

Electron Microscopy (SEM & TEM)

Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro

Tabletop Scanning Electron Microscope - NANOS

Electron Microscopy (SEM & TEM)

Tabletop Scanning Electron Microscope - NANOS

XRF Microscope AttoMap-310

3D X-ray Microscopy (XRM)

XRF Microscope AttoMap-310

Atomic Force Microscopy Jupiter XR

Atomic Force Microscopy (AFM)

Atomic Force Microscopy Jupiter XR

[sku-1686625497660] Cypher S / Cypher ES Atomic Force Microscope

Atomic Force Microscopy (AFM)

Cypher S / Cypher ES Atomic Force Microscope

[SKU-1685068240118] X-ray Photoelectron Spectrometry (XPS) SPECS ProvenX

csm_provenx-arpes_system-madrid-0270-back_774eaca759.jpg

High-Resolution Ultra-Trace Analysis

X-ray Photoelectron Spectrometry (XPS) SPECS ProvenX

[SKU-1686556075871] CryoRaman Microscope

Raman Microscopy

CryoRaman Microscope

[sku-1699331332697] Alpha300 access Confocal Microscope

Raman Microscopy

Alpha300 access Confocal Microscope

Time-of-Flight ICP-MS Vitesse

Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICPMS-TOF)

Time-of-Flight ICP-MS Vitesse

[64219-64222-3292552] Alpha300 R Confocal Raman Microscope

Raman Microscopy

Alpha300 R Confocal Raman Microscope

[SKU-1686723608616] X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA

Enviro%20ion%20source.jpg

High-Resolution Ultra-Trace Analysis

X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA

[SKU-1679470017202] Secondary ion mass spectrometry 1300-HR³

Secondary Ion Mass Spectrometry (SIMS)

Secondary ion mass spectrometry 1300-HR³

XRF Microscope AttoMap-200

3D X-ray Microscopy (XRM)

XRF Microscope AttoMap-200

IMS 7f‑Auto Secondary Ion Mass Spectrometer

Secondary Ion Mass Spectrometry (SIMS)

IMS 7f‑Auto Secondary Ion Mass Spectrometer

Secondary Ion Mass Spectrometry (SIMS) - ACTINIS

Secondary Ion Mass Spectrometry (SIMS)

Secondary Ion Mass Spectrometry (SIMS) - ACTINIS

NanoSIMS 50L

Secondary Ion Mass Spectrometry (SIMS)

NanoSIMS 50L

[SKU-1679470043724] IMS 7f-GEO

Secondary Ion Mass Spectrometry (SIMS)

IMS 7f-GEO

[64223-64218-3290546] TriLambda-30 X-ray Microscope

3D X-ray Microscopy (XRM)

TriLambda-30 X-ray Microscope

[63716-64223-3285887] FE - LEEM/PEEM P90 AC

Micro & Nano Imaging

FE - LEEM/PEEM P90 AC

[64219-64787-3290658] X-ray Microscope (XRM) 3D Apex XCT-150

3D X-ray Microscopy (XRM)

X-ray Microscope (XRM) 3D Apex XCT-150

Scanning electron microscope - Focused Ion Beam DB550

235347323617fd7a93621212b35f8299_medium (1).webp

Electron Microscopy (SEM & TEM)

Scanning electron microscope - Focused Ion Beam DB550

Showing 21 of 25 results

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Application

Material Sciences
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Specical Technique

Non-destructive (NDT)
Isotope & Radiation
Laser & Plasma
Quantum & Superconducting
Ultra-high vacuum
Lithography

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ADST Vietnam is the commercial division for advanced scientific and technological equipment under An Dong Science and Technology Joint Stock Company. Established in 2000, the company is a pioneer in innovation that has accompanied scientists for many years. Backed by extensive experience, ADST leads the market in delivering high-tech equipment and solutions, earning the trust of customers and the confidence of many world-renowned manufacturers.

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