Mechanism of nuclear glass transformation (SIMS) The long-term behavior of glass types used to contain nuclear waste is a top concern to ensure safe geological disposal. To understand the mechanisms of glass alteration, it is important to study the ... Semiconductor
Helium migration in nuclear reactors (SIMS) In nuclear reactors, the movement and retention of helium can lead to blistering, hardening, and breakage due to severe embrittlement, blistering... To ensure the longevity of structural nuclear mater... Semiconductor
Deep and shallow implant depth analysis (SIMS) In semiconductor technology, materials and thus analytical issues are changing rapidly. Thanks to its superior depth analysis capability, the CAMECA IMS 7f-Auto is widely used to monitor dopants in th... Semiconductor
Contamination control (SIMS) Controlling impurities by SIMS – High-performance trace analysis for light elements Conventional microanalysis techniques such as Glow Discharge Mass Spectrometry (Glow Discharge Mass Spectrometry - G... Semiconductor
Measuring ultra-shallow implants (EXLIE SIMS) The production of the latest semiconductor chips and the continued miniaturization of CMOS components are pushing the limits of junction depth (junction depth) below 10nm, with profile steepness (prof... Advanced Materials Semiconductor
Atomic scale characteristics of the derivative (APT) As transistor structures continue to shrink to keep pace with Moore's Law the existing analysis and metrology techniques currently in use will no longer be sufficient to fully characterize the nanosc... Semiconductor
