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Electron Microscopy (SEM & TEM)
Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro
The CIQTEK SEM5000Pro uses advanced Super-Tunnel electronic optical technology to create a beam path without intersection points and employs a combination of electrostatic and electromagnetic lens design. These improvements help reduce space charge effects, minimize lens aberration, and achieve a resolution of 1.2 nm at 1 kV, providing a solution for direct observation of non-conductive or semiconductor samples.
Confocal Microscopy
Andor BC43 Benchtop Microscope

Andor BC43 is a line of benchtop microscopes integrated with three modes of imaging: widefield, high-speed confocal, and super resolution that can be upgraded on site. Using spinning disk technology, the BC43 provides clear images, 10 times faster than point-scanning confocal, with super resolution reaching 140-180 nm. An ideal solution for cell biology, developmental biology, neuroscience, cancer, and tissue.

Electron Microscopy (SEM & TEM)
Tabletop Scanning Electron Microscope - NANOS

NANOS is designed to be compact and modern, providing high-resolution imaging capabilities (< 8nm) and rapid high-quality elemental analysis with a magnification of 200,000x. NANOS becomes the ideal solution for research, industrial, and environmental applications.

3D X-ray Microscopy (XRM)
XRF Microscope AttoMap-310

The AttoMap-310 provides trace element mapping capabilities with an exceptional sensitivity that is 1000 times higher than SEM-EDS. Sigray's proprietary X-ray source technology enables a spatial resolution down to <3-5µm and speeds up to 5ms/point, delivering a breakthrough solution for semiconductor research, mineralogy, and materials science.

3D Atom Probe (APT)
3D Atom Probe Tomography APT EIKOS

Possessing atomic probe tomography (APT) technology, EIKOS-UV atomic probe microscope brings the ability to detect single atoms with near-atomic spatial resolution. The device provides a quantitative 3D compositional map, being the optimal cost-effective solution for metallurgical research, additive manufacturing (3D printing), and thin films with superior performance.

Atomic Force Microscopy (AFM)
Atomic Force Microscopy Jupiter XR

Jupiter XR is a large sample AFM that integrates both high-speed scanning and an extended scan range in a single probe (XR scanner). The proprietary blueDrive™ Tapping Mode technology simplifies operation, increases repeatability, and extends probe lifespan. The laser and detector system is fully controlled by software. An ideal solution for industrial measurement, material R&D, semiconductors, polymers and diverse research.

Atomic Force Microscopy (AFM)
Cypher S / Cypher ES Atomic Force Microscope

The Cypher line is the highest resolution AFM, the fastest scanning and the easiest to use in its segment. The blueDrive™ technology uses photothermal excitation instead of piezoelectric, making the Tapping Mode stable, clean, and easy to use in both liquids. The Cypher S is suitable for materials and biological research in air or liquid. The Cypher ES adds temperature control of 0–250°C, gas/liquid perfusion, strong chemical compatibility, ideal for experiments in harsh environments.

Raman Microscopy
CryoRaman Microscope

cryoRaman is a low-temperature Raman microscope with cryostat technology and advanced nanopositioner from attocube. The system allows for the acquisition of Raman images with superior spatial resolution at extremely low temperatures, down to 1.8K, in high magnetic fields up to 12 Tesla. Developed for scientists researching two-dimensional materials (MoS₂, WSe₂), phase transitions, excitons, and emerging quantum phenomena at temperatures close to absolute zero.

Raman Microscopy
Alpha300 access Confocal Microscope

Alpha300 access is a Raman system designed as an ideal starting point for WITec's Raman imaging technology in budget-constrained environments. Even in the entry segment, the system still provides high-performance Raman mapping, superior spectral quality thanks to the UHTS spectrometer, precise optical components, and in-depth knowledge of Raman. It can be upgraded to more powerful configurations of the alpha300 R line later.

Raman Microscopy
Alpha300 R Confocal Raman Microscope

The Alpha300 R is a confocal Raman microscope that meets various requirements – from micro-Raman mapping to high-speed 3D imaging. The Fast Raman Imaging™ technology with motorized capabilities allows for image acquisition at superior speeds. It can be upgraded to integrate AFM, SNOM, TERS, and other correlative modes, suitable for all fields from materials science, geology, to biology and pharmaceuticals.

3D X-ray Microscopy (XRM)
XRF Microscope AttoMap-200
MicroXRF laboratory achieves the highest resolution with a micron-sized unit (3-5 µm) using high-resolution optics. Sensitivity below ppm for quantification down to parts per million (ppm). Along with Sigray's flexible software packages for energy tuning, maximizing throughput and sensitivity with up to 5 different angled X-ray spectra.  
3D X-ray Microscopy (XRM)
TriLambda-30 X-ray Microscope

TriLambdaXRM-30 (nanoXRM) utilizes Sigray's proprietary X-ray optics technology to provide cutting-edge resolution of 35nm. The device integrates up to 3 X-ray energy sources simultaneously to optimize the 3D nanoXRM image contrast for all types of materials from polymers to metals, providing a perfect non-destructive sample solution for batteries and biology.

Micro & Nano Imaging
FE - LEEM/PEEM P90 AC

SPECS FE-LEEM/PEEM P90 Series is a next-generation surface electron microscope system, combining a breakthrough between LEEM and PEEM techniques in a minimalist, ultra-stable modular design. Equipped with a Cold Field Emission Gun and an integrated energy filter, the system provides micro-spectral analysis capabilities and displays thin film structure images with superior spatial resolution below 2nm. This is the optimal analytical solution for in situ surface kinetics studies in situ, advanced materials science, and nanotechnology

3D X-ray Microscopy (XRM)
X-ray Microscope (XRM) 3D Apex XCT-150

The Apex XCT-150 is an X-ray microscope that delivers incredible results by providing sub-micron resolution 3D imaging in just minutes. It is an advanced tool for failure analysis and packaging in the semiconductor industry. The system features a spatial resolution of 0.5 microns anywhere on samples up to 300 mm in diameter. With the Apex XCT, failure analysis workflows can be streamlined by imaging entire intact packages, wafers, and PCBs, minimizing time-consuming and destructive sample preparation.

Electron Microscopy (SEM & TEM)
Scanning electron microscope - Focused Ion Beam DB550
FIB-SEM|DB550 integrated with electron optical technology SuperTunnel breakthrough with Gallium ion beam (Ga⁺ liquid metal ion source), providing a resolution of 3nm and sharp images. The device helps optimize the analysis and sample preparation process TEM specimen preparation, perfectly applicable for the semiconductor (semiconductor) field and materials science.
Probe Stations & Testing
Nanoindentation Tester ENT-5

The nano hardness measurement system provides high data reproducibility by minimizing environmental noise effects during measurement. Test load: 0.5 µN ~ 2 N. Simple operation and high data reproducibility. 


Electron Microscopy (SEM & TEM)
High Speed Scanning Electron Microscope HEM6000

CIQTEK HEM6000 integrates technologies such as a high-brightness electron gun with a large beam current, a high-speed electron beam deflection system, and a high voltage sample deceleration mechanism. The device accelerates the speed of large-scale nano structure imaging up to 5 times faster than conventional FESEM, providing a perfect large-scale 3D reconstruction solution for the semiconductor and biological industries (biological 3D reconstruction).

Atomic Force Microscopy (AFM)
Atomic Force Microscopy Model MFP-3D BIO / Infinity / Origin
The MFP-3D series from Asylum Research offers versatile AFM systems, from large samples to integrated inverted microscopy. The MFP-3D BIO is a fully integrated AFM with optical microscopy, allowing for simultaneous AFM and fluorescence/phase contrast imaging. The MFP-3D Infinity is the highest performance large sample AFM with a background noise of <20 pm. The MFP-3D Origin/Origin+ is a budget-friendly line that still maintains the quality of Asylum. All support imaging in air and liquid, precise picoNewton force measurements, and dozens of extended modes (PFM, CAFM, KPFM, AM-FM, …).
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