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X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroMETROS Enviro%20ion%20source.jpg
HR Ultra-Trace Analysis
X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroMETROS

SPECS EnviroMETROS is the next generation of XPS surface measurement systems (Surface Hybrid Metrology) that is revolutionary, designed specifically for analyzing the chemical composition in depth of thin films from laboratory scale to semiconductor manufacturing. The system integrates core technology of angle-resolved X-ray photoelectron spectroscopy (ARXPS) that is fully automated, combining flexible multi-source X-ray energy and the ability to operate in a very wide pressure range from ultra-high vacuum (UHV) to near-atmospheric pressure (NAP). This is the optimal solution for analyzing layer structure and material properties without destroying the sample.

Atomic Force Microscopy Model MFP-3D BIO / Infinity / Origin MFP-3D-Origin-Plus-AFM-Product-Image-compressed-1350x1175.png
Atomic Force Microscopy (AFM)
Atomic Force Microscopy Model MFP-3D BIO / Infinity / Origin
The MFP-3D series from Asylum Research offers versatile AFM systems, from large samples to integrated inverted microscopy. The MFP-3D BIO is a fully integrated AFM with optical microscopy, allowing for simultaneous AFM and fluorescence/phase contrast imaging. The MFP-3D Infinity is the highest performance large sample AFM with a background noise of <20 pm. The MFP-3D Origin/Origin+ is a budget-friendly line that still maintains the quality of Asylum. All support imaging in air and liquid, precise picoNewton force measurements, and dozens of extended modes (PFM, CAFM, KPFM, AM-FM, …).
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