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15 items found.

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Method & Application
Measurement & Error Analysis - 15 items

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RESET

Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro

Electron Microscopy (SEM & TEM)

Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro

Tabletop Scanning Electron Microscope - NANOS

Electron Microscopy (SEM & TEM)

Tabletop Scanning Electron Microscope - NANOS

Atomic Force Microscopy Jupiter XR

Atomic Force Microscopy (AFM)

Atomic Force Microscopy Jupiter XR

[SKU-1685068240118] X-ray Photoelectron Spectrometry (XPS) SPECS ProvenX

csm_provenx-arpes_system-madrid-0270-back_774eaca759.jpg

High-Resolution Ultra-Trace Analysis

X-ray Photoelectron Spectrometry (XPS) SPECS ProvenX

Time-of-Flight ICP-MS Vitesse

Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICPMS-TOF)

Time-of-Flight ICP-MS Vitesse

[SKU-1686723608616] X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA

Enviro%20ion%20source.jpg

High-Resolution Ultra-Trace Analysis

X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA

XRF Microscope AttoMap-200

3D X-ray Microscopy (XRM)

XRF Microscope AttoMap-200

SIMS 7f-Auto Secondary Ion Mass Spectrometer

Secondary Ion Mass Spectrometry (SIMS)

SIMS 7f-Auto Secondary Ion Mass Spectrometer

Secondary Ion Mass Spectrometry (SIMS) - ACTINIS

Secondary Ion Mass Spectrometry (SIMS)

Secondary Ion Mass Spectrometry (SIMS) - ACTINIS

[64223-64218-3290546] TriLambda-30 X-ray Microscope

3D X-ray Microscopy (XRM)

TriLambda-30 X-ray Microscope

[63716-64223-3285887] FE - LEEM/PEEM P90 AC

Micro & Nano Imaging

FE - LEEM/PEEM P90 AC

Scanning electron microscope - Focused Ion Beam DB550

235347323617fd7a93621212b35f8299_medium (1).webp

Electron Microscopy (SEM & TEM)

Scanning electron microscope - Focused Ion Beam DB550

High Speed Scanning Electron Microscope HEM6000

Electron Microscopy (SEM & TEM)

High Speed Scanning Electron Microscope HEM6000

Secondary Ion Mass Spectrometry (SIMS) AKONIS

Secondary Ion Mass Spectrometry (SIMS)

Secondary Ion Mass Spectrometry (SIMS) AKONIS

X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroMETROS

Enviro%20ion%20source.jpg

High-Resolution Ultra-Trace Analysis

X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroMETROS

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