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Accelerator Mass Spectrometry (AMS)
Mini Carbon Dating System ¹⁴C (MICADAS)

MICADAS is the leading AMS ¹⁴C system from Ionplus AG, providing superior accuracy, energy efficiency, and a compact design for advanced radiocarbon dating applications.

Accelerator Mass Spectrometry (AMS)
Multi-Isotope Low-Energy AMS light (MILEA Light)

Discover MILEA light, the compact multi-isotope Accelerator Mass Spectrometry (AMS) solution from Ionplus AG. Optimized for high-performance measurements of ¹⁰Be, ¹⁴C và ²⁶Al, it is the ideal choice for advanced applications in geosciences and radiocarbon research.

Accelerator Mass Spectrometry (AMS)
Multi-Isotope Low-Energy AMS (MILEA)

The new generation multi-isotope accelerator mass spectrometry (AMS) system from Ionplus AG features a world-leading compact design (only 3.5m x 7m), the ability to accurately analyze multiple isotopes (such as ¹⁰Be, ¹⁴C, ²⁶Al...), and user-friendly operation. MILEA delivers outstanding performance without the need for SF₆ gas, optimized for advanced scientific research.

High-Resolution Ultra-Trace Analysis
X-ray Photoelectron Spectrometry (XPS) SPECS ProvenX

Danh mục sản phẩm của SPECS đã được mở rộng với dòng hệ thống quang phổ XPS ProvenX, đại diện cho đỉnh cao từ nền tảng kiến thức rộng lớn của chúng tôi trong việc phát triển và sản xuất các hệ thống phân tích toàn diện nhằm đáp ứng những yêu cầu khoa học khắt khe nhất. ProvenX bao gồm một loạt các hệ thống XPS chuyên dụng cho ARPES, µ-ARPES, Kính hiển vi động lượng (Momentum Microscopy), XPS/UPS cũng như NAP-XPS.

Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS)
Enhanced Sensitivity High Resolution ICP-MS Attom ES

Attom ES is a high-frequency inductively coupled plasma mass spectrometry system with dual-focusing technology, specializing in the rapid and accurate analysis of isotope ratios and trace elements in solid/liquid sample matrices. With a wide dynamic range detection system & recording data for up to 73 elements in <105ms, Attom ES is a powerful solution for geochronology, environmental science, and nanomaterials research.

Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS)
Multi-Collector ICP-MS Plasma 3

Plasma 3 is a multi-collector mass spectrometry system specialized for multi-isotope analysis with high accuracy and repeatability. The device features a variable Zoom lens that allows switching between isotope systems without moving the detector. It has a static detector array with 16 Faraday cups and up to 6 ion counting detectors. It is the optimal solution for Earth science, environmental, nuclear, archaeological, forensic, and biomedical applications.

Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS)
Collision Cell Multi-Collector ICP-MS Sapphire

Sapphire is a Multi-Collector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS) system featuring a proprietary dual-path technology, integrating a collision/reaction cell to thoroughly eliminate spectral interferences from the argon source. The instrument possesses two distinct ion paths: a high-energy path (6 kV) for traditional isotope analyses, and a low-energy path (4 kV) routed through the reaction hexapole. It stands as an ideal solution for analyses in geochemistry, cosmochemistry, and life sciences

Multicollector Inductively Coupled Plasma Mass Spectrometry (MC-ICPMS)
High Resolution Multi-Collector ICP-MS Plasma 1700

Nu Plasma 1700 is a multi-collector mass spectrometry system (MC-ICP-MS) designed for large mass dispersion (mass dispersion ~1700 mm). The device can achieve a resolution of >30,000, while at levels >5,000 it still maintains a flat-top peak, preserving almost absolute sensitivity. Each detector is equipped with independently adjustable slits. An optimal solution in geochemistry, cosmochemistry, and life sciences.

Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICPMS-TOF)
Time-of-Flight ICP-MS Vitesse

Vitesse is an Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICP-TOF-MS) system, specifically designed for high-speed multi-element applications such as laser ablation imaging and nanoparticle analysis. It features a segmented reaction cell and powerful interference removal capabilities, making it an ideal solution for geochemical, biological, environmental, and materials research.

Thermal Ionization Mass Spectrometry (TIMS)
Thermal Ionisation Mass Spectrometry TIMS

Nu TIMS is a thermal ionization mass spectrometry system developed based on variable dispersion multi-collector technology. Nu TIMS achieves peak accuracy with a mass range of 5–300 amu, outstanding sensitivity, and fully automated operation. An optimal solution for U-Pb geochronology, radioactive isotope analysis (Sr, Nd, Pb) and nuclear, environmental, and cosmochemical applications.

High-Resolution Ultra-Trace Analysis
X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA

SPECS' EnviroESCA is an electron spectroscopy system for chemical analysis in real-world environmental conditions thanks to breakthrough (N)AP-XPS technology. The device operates at pressures of up to hundreds of mbar, integrating a micro-focused AlKalpha monochromatic X-ray source and Environmental Charge Compensation to automatically neutralize background charging. EnviroESCA minimizes the time from loading to measuring samples, ideal for research on biological materials, polymers, batteries, catalysts, and liquids.

Secondary Ion Mass Spectrometry (SIMS)
Secondary ion mass spectrometry 1300-HR³

Is the generation of large configuration secondary ion mass spectrometers (LG-SIMS) the most advanced from CAMECA, a device that provides sensitivity and spatial resolution - mass at an absolute level. This is the optimal cost-effective analytical solution for geochemical research, trace element measurement, mineral dating, and analysis of micro-particles for nuclear safety control.

Secondary Ion Mass Spectrometry (SIMS)
SIMS 7f-Auto Secondary Ion Mass Spectrometer

Equipped with dual magnetic convergence SIMS technology, the IMS 7f-Auto secondary ion mass spectrometer provides excellent depth resolution with a detection limit of ppb. This is a fully automated analytical solution that delivers high throughput for the semiconductor, optoelectronics, and materials industries, maximizing productivity with continuous operation 24/7.

X-ray Absorption Spectroscopy (XAS)
X-ray Absorption Spectroscopy (XAS) QuantumLeap-H2000

QuantumLeap is an advanced X-ray Absorption Spectroscopy (XAS) system featuring dual transmission and fluorescence modes. The system offers a wide energy range from 4.5 to 25 keV and stands as the only laboratory-scale XAS that delivers synchrotron-equivalent performance directly to your lab, providing solutions for batteries and solar cells, catalysis, and heavy element research.

Secondary Ion Mass Spectrometry (SIMS)
Secondary Ion Mass Spectrometry (SIMS) - ACTINIS

Developed from the renowned IMS 7f platform, the secondary ion mass spectrometry (SIMS) with ACTINIS casing features an advanced radiation protection system, allowing for the measurement of radioactive samples up to 2 Gy/h. The device achieves sub-micron spatial resolution, optimizing transmission and the ability to measure isotope ratios. This is a safe automation solution, ideal for optimizing the nuclear fuel cycle and waste management.

Secondary Ion Mass Spectrometry (SIMS)
NanoSIMS 50L
It is an advanced secondary ion mass spectrometer (SIMS), NanoSIMS 50L featuring a proprietary co-axial optical design. The device analyzes isotopes and trace elements at a resolution of <50 nm, ppm sensitivity with parallel acquisition speed. This is a superior analytical solution dedicated to research in geology, cell biology and materials science.
X-ray Absorption Spectroscopy (XAS)
X-ray absorption spectroscopy (XAS) QuantumLeap-V210

The first XAS system capable of analyzing low atomic number samples and micro-point analysis. Allows XANES measurements at 0.7 eV and EXAFS within seconds or minutes. MicroXAS with a spot size of 100 microns with an automated sample stage allows XAS mapping at a resolution of 100 µm on a sample. It is the leading solution for battery research, catalysis, and materials science.

Secondary Ion Mass Spectrometry (SIMS)
IMS 7f-GEO

Is a secondary ion mass spectrometer IMS 7f-GEO specialized from CAMECA, integrating a dual detector (FC/FC) and Electron Multiplier. The device offers an ultra-fast peak switching speed of 0.3s, reducing measurement time from >3000s to 56s. This is the optimal High-throughput solution for analyzing stable isotopes and rare earth elements (REE) in geochemistry.

Stable Isotope Ratio Mass Spectrometry (IRMS)
Isotope Ratio Mass Spectrometry Horizon 2

Horizon 2 is a stable isotope mass spectrometry system designed for both Dual Inlet (DI) and Continuous Flow (CF) analysis. The proprietary Zoom Optics system combined with narrow Faraday cups allows simultaneous monitoring of masses from 1 to 100 with precise peak matching. An ideal solution for geochemistry, environmental science, food traceability, and forensics.

Stable Isotope Ratio Mass Spectrometry (IRMS)
Isotope Ratio Mass Spectrometry Perspective

Perspective is a stable isotope mass spectrometry system with a versatile collector supporting up to 12 Faraday detectors along with proprietary Zoom Optics technology. Flexibly integrates both Dual Inlet (DI) and Continuous Flow (CF) analysis, enabling accurate analysis of stable isotopes C, N, O, S, H. An ideal solution for geochemistry, environmental science, food traceability, forensics, and advanced clumped isotopes analysis.

High-Resolution Ultra-Trace Analysis
X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroMETROS

SPECS EnviroMETROS is the next generation of XPS surface measurement systems (Surface Hybrid Metrology) that is revolutionary, designed specifically for analyzing the chemical composition in depth of thin films from laboratory scale to semiconductor manufacturing. The system integrates core technology of angle-resolved X-ray photoelectron spectroscopy (ARXPS) that is fully automated, combining flexible multi-source X-ray energy and the ability to operate in a very wide pressure range from ultra-high vacuum (UHV) to near-atmospheric pressure (NAP). This is the optimal solution for analyzing layer structure and material properties without destroying the sample.

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