Andor BC43 is a line of benchtop microscopes integrated with three modes of imaging: widefield, high-speed confocal, and super resolution that can be upgraded on site. Using spinning disk technology, the BC43 provides clear images, 10 times faster than point-scanning confocal, with super resolution reaching 140-180 nm. An ideal solution for cell biology, developmental biology, neuroscience, cancer, and tissue.

NANOS is designed to be compact and modern, providing high-resolution imaging capabilities (< 8nm) and rapid high-quality elemental analysis with a magnification of 200,000x. NANOS becomes the ideal solution for research, industrial, and environmental applications.

Jupiter XR is a large sample AFM that integrates both high-speed scanning and an extended scan range in a single probe (XR scanner). The proprietary blueDrive™ Tapping Mode technology simplifies operation, increases repeatability, and extends probe lifespan. The laser and detector system is fully controlled by software. An ideal solution for industrial measurement, material R&D, semiconductors, polymers and diverse research.

The Cypher line is the highest resolution AFM, the fastest scanning and the easiest to use in its segment. The blueDrive™ technology uses photothermal excitation instead of piezoelectric, making the Tapping Mode stable, clean, and easy to use in both liquids. The Cypher S is suitable for materials and biological research in air or liquid. The Cypher ES adds temperature control of 0–250°C, gas/liquid perfusion, strong chemical compatibility, ideal for experiments in harsh environments.

cryoRaman is a low-temperature Raman microscope with cryostat technology and advanced nanopositioner from attocube. The system allows for the acquisition of Raman images with superior spatial resolution at extremely low temperatures, down to 1.8K, in high magnetic fields up to 12 Tesla. Developed for scientists researching two-dimensional materials (MoS₂, WSe₂), phase transitions, excitons, and emerging quantum phenomena at temperatures close to absolute zero.

Is the generation of large configuration secondary ion mass spectrometers (LG-SIMS) the most advanced from CAMECA, a device that provides sensitivity and spatial resolution - mass at an absolute level. This is the optimal cost-effective analytical solution for geochemical research, trace element measurement, mineral dating, and analysis of micro-particles for nuclear safety control.

Equipped with dual magnetic convergence SIMS technology, the IMS 7f-Auto secondary ion mass spectrometer provides excellent depth resolution with a detection limit of ppb. This is a fully automated analytical solution that delivers high throughput for the semiconductor, optoelectronics, and materials industries, maximizing productivity with continuous operation 24/7.

Developed from the renowned IMS 7f platform, the secondary ion mass spectrometry (SIMS) with ACTINIS casing features an advanced radiation protection system, allowing for the measurement of radioactive samples up to 2 Gy/h. The device achieves sub-micron spatial resolution, optimizing transmission and the ability to measure isotope ratios. This is a safe automation solution, ideal for optimizing the nuclear fuel cycle and waste management.

Is a secondary ion mass spectrometer IMS 7f-GEO specialized from CAMECA, integrating a dual detector (FC/FC) and Electron Multiplier. The device offers an ultra-fast peak switching speed of 0.3s, reducing measurement time from >3000s to 56s. This is the optimal High-throughput solution for analyzing stable isotopes and rare earth elements (REE) in geochemistry.

TriLambdaXRM-30 (nanoXRM) utilizes Sigray's proprietary X-ray optics technology to provide cutting-edge resolution of 35nm. The device integrates up to 3 X-ray energy sources simultaneously to optimize the 3D nanoXRM image contrast for all types of materials from polymers to metals, providing a perfect non-destructive sample solution for batteries and biology.

The Apex XCT-150 is an X-ray microscope that delivers incredible results by providing sub-micron resolution 3D imaging in just minutes. It is an advanced tool for failure analysis and packaging in the semiconductor industry. The system features a spatial resolution of 0.5 microns anywhere on samples up to 300 mm in diameter. With the Apex XCT, failure analysis workflows can be streamlined by imaging entire intact packages, wafers, and PCBs, minimizing time-consuming and destructive sample preparation.

CIQTEK HEM6000 integrates technologies such as a high-brightness electron gun with a large beam current, a high-speed electron beam deflection system, and a high voltage sample deceleration mechanism. The device accelerates the speed of large-scale nano structure imaging up to 5 times faster than conventional FESEM, providing a perfect large-scale 3D reconstruction solution for the semiconductor and biological industries (biological 3D reconstruction).