Main features
- Automatically selects the coating thickness evaluation method to optimize the relative measurement error.
- Remotely controls electronic devices and analysis software via ETHERNET interface from the workstation device and communicates with the OPC server.
- Operation and service are very simple and convenient.
- The measuring block can be installed underneath and/or above the material to be measured.
Detailed description
Technology & Principle:
The coating thickness analysis device is a tool used for accurate and precise measurement using X-ray fluorescence (XRF) method. The device operates based on the principle of exciting the elements in the coating, then receiving the characteristic X-ray fluorescence spectrum through a Peltier-cooled SDD probe to determine the coating thickness. The system uses an integrated industrial computer along with an algorithm that automatically selects the evaluation method to optimize the relative measurement error.
Optimizes the relative measurement error of the measurements by automatically selecting the coating thickness evaluation method.
Eliminates measurement errors thanks to the ability to automatically select the appropriate thickness calculation method, optimizing the relative error to < 3% with a measurement time of only 5 seconds.
User-friendly software guide
Optimize operating time with visual guides, allowing users to create new analysis methods in just a few minutes.
Integration/ Expansion:
The system supports measuring the thickness of metal and non-metal coatings (from Mg to U) on all types of substrates. The device includes a measuring unit, an X-ray warning display unit, an emergency stop button, and a workstation. All analysis is managed through software with tiered interfaces for Administrators and Operators. The system is compatible with a power supply of 230/380 VAC (50/60 Hz), operating in a temperature range of +5 to +40 °C, suitable for controlling and monitoring online industrial processes.