Is the generation of Large Geometry SIMS (LG‑SIMS) the most advanced from CAMECA, a device that provides sensitivity and spatial resolution - mass at an absolute level. This is the optimal cost-effective analytical solution for geochemical research, trace element measurement, mineral dating, and analysis of microparticles for nuclear safeguards.

Is a secondary ion mass spectrometer IMS 7f-GEO specialized from CAMECA, integrating a dual detector (FC/FC) and Electron Multiplier. The device offers an ultra-fast peak switching speed of 0.3s, reducing measurement time from >3000s to 56s. This is the optimal High-throughput solution for analyzing stable isotopes and rare earth elements (REE) in geochemistry.

The Apex XCT-150 is an X-ray microscope that delivers incredible results by providing sub-micron resolution 3D imaging in just minutes. It is an advanced tool for failure analysis and packaging in the semiconductor industry. The system features a spatial resolution of 0.5 microns anywhere on samples up to 300 mm in diameter. With the Apex XCT, failure analysis workflows can be streamlined by imaging entire intact packages, wafers, and PCBs, minimizing time-consuming and destructive sample preparation.

CIQTEK HEM6000 integrates technologies such as a high-brightness electron gun with a large beam current, a high-speed electron beam deflection system, and a high voltage sample deceleration mechanism. The device accelerates the speed of large-scale nano structure imaging up to 5 times faster than conventional FESEM, providing a perfect large-scale 3D reconstruction solution for the semiconductor and biological industries (biological 3D reconstruction).