Skip to Content
Secondary ion mass spectrometry 1300-HR³

Price:

0 ₫

X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA
X-ray Photoelectron Spectrocopy (XPS) SPECS EnviroESCA
XRF Microscope AttoMap-200
XRF Microscope AttoMap-200

Secondary ion mass spectrometry 1300-HR³

Is the generation of Large Geometry SIMS (LG‑SIMS) the most advanced from CAMECA, a device that provides sensitivity and spatial resolution - mass at an absolute level. This is the optimal cost-effective analytical solution for geochemical research, trace element measurement, mineral dating, and analysis of microparticles for nuclear safeguards.

4 people are viewing this right now
0 ₫ 0 ₫

  • Field of Study
  • Brand - Cameca
  • Sample materials
Cameca
Cameca

The world's number one manufacturer of Secondary Ion Mass Spectrometry (SIMS) and Atom Probe Tomography (APT) equipment.

Tags

Main features


  • Large Geometry SIMS design (LG-SIMS): Thoroughly optimizes signal sensitivity even at extremely high mass resolution, completely eliminating background noise.
  • Flexible multi-collector system: Integrates up to 7 parallel signal detection units (Faraday Cup and Electron Multiplier) for extremely fast and accurate analysis of multiple isotopes simultaneously.
  • Ultra-sensitive 10¹² Ω electrometer: Equipped on Faraday cup circuit boards to eliminate electromagnetic noise, ideal for measuring low‑count‑rate signals in materials.
  • High-density dual ion source: Integrates RF oxygen plasma source and cesium microbeam source to provide strong brightness, enhancing beam density to significantly improve data repeatability and throughput.
  • High-throughput automation: The motorized sample chamber comes with automatic Z‑axis height alignment, maintaining a fixed operating distance and allow unattended analysis of large sample sets.
  • UV microscopy optical positioning: Significantly upgrade surface resolution using ultraviolet (UV-light) microscopy, optimizing the navigation and positioning of sensitive points on materials.

Detailed description


Advanced Large Geometry SIMS technology

CAMECA IMS 1300-HR³ marks a powerful breakthrough in the platform of large configuration secondary ion mass spectrometry equipment. Unlike conventional analytical systems, the IMS 1300-HR³ combines a high-density primary ion source with a large‑magnet sector field design, providing unmatched sensitivity and mass resolution. Additionally, the system is equipped with a normal-incidence electron gun that creates an electron flood for optimal charge compensation, maintaining ultra-stable signals on the surface of insulating materials in ultra-high vacuum (UHV) environments.

Eliminating barriers to micro-particle measurement and trace isotope analysis

Collecting accurate isotope information or analyzing trace elements at ppm levels has always been a time-consuming challenge in geochemistry. The IMS 1300-HR³ thoroughly addresses this difficulty through excellent 2D and 3D imaging capabilities in both microprobe and microscope modes. Samples are positioned at a sub-micron level, meeting the most stringent requirements for measuring ancient minerals (U-Th-Pb), studying stable isotopes (C, O, S, Mg...), or detecting Uranium for nuclear security applications.

Maximizing automation capabilities and data management

The system allows for a efficient processing of large analytical volumes thanks to the built-in comprehensive automated software platform. The heart of the system's software is the APM (Automated Particle Measurement) tool, which has the ability to self-identify, filter, and quantify isotopes on millions of ultra-fine particles in an instant. The data is then directly visualized using WinImage and Geochronology, minimizing data processing time and ensuring highly accurate results.

Detailed specifications


Primary ion sourceRF-plasma Oxygen & Cesium microbeam
Detector systemFlexible multi-detector system, up to 7 signal acquisition positions
Type of signal receiverFaraday Cup (FC) & Electron Multiplier (EM)
Current amplifierFaraday cup circuit board using low-noise 10¹² Ω resistor
Imaging display capabilitySub-micron resolution; Supports 2D and 3D imaging
Charge compensationNormal-incidence Electron Gun
Surface opticsUV-light microscope
Analysis chamber environmentUltra-high vacuum (UHV)
Software ecosystemWinCurve, WinImage, APM, Geochronology, Navigator


Field of Study Earth Sciences
Brand Cameca
Sample materials Minerals & Environment
ims1300-hr3_product-brochure_compressed.pdf
Download
Secondary ion mass spectrometry 1300-HR³
Secondary ion mass spectrometry 1300-HR³
0 ₫