Main features
- Wide spectral range from ultraviolet (UV) excitation to near-infrared (NIR) with top resolution.
- Simultaneous installation of up to 6 objectives from various suppliers, with software-controlled options to enhance sample safety.
- Illumination from above or below. Transmission and reflection modes.
- Lens design for high performance/throughput with a wide spectral range (350 to 1100 nm), up to 6 diffraction gratings, with focal lengths of 300 mm and 600 mm.
- Integrated software for microscope control, automation, and data analysis.
Detailed description
Technology & Principles
Witec 360 is a new generation high-resolution confocal Raman microscope for industrial research and analysis. The device operates based on the principle of using a differential laser beam to excite the sample (supporting a wavelength range from UV to NIR), collecting the confocal Raman scattering signal using a fibre-coupled optical detector, and then analyzing the spectrum through the Hexalight (or Monolight) spectrometer based on the proprietary Olaf-Hollricher-Design (OHD) lens design combined with Dielectric diffraction mirrors to create non-destructive 2D/3D structural and chemical microscopic images at the diffraction limit.
High performance/throughput in a wide wavelength range
Thoroughly address the reduction of spectral signal intensity in the wavelength range from 350 nm to 1100 nm by completely eliminating the use of Aluminum (Al) and Silver (Ag) mirrors in the signal transmission path, optimizing the photon yield obtained.
Resolution is optimized and contrast is ensured.
Ensure the highest contrast and optimal depth resolution (achieving a diffraction limit of < 300nm horizontally and < 950nm vertically at a wavelength of 532 nm), collecting weak Raman signals at extremely low excitation power levels.
Combine multiple analytical methods on the same sample point.
Help researchers avoid moving samples through different devices by directly integrating Raman spectroscopy with Photoluminescence (PL), Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM-EDS / RISE), Second Harmonic Generation (SHG), Profilometry, and SNOM.
Integration/ Expansion:
A system integrating X, Y, Z moving sample stages (manual, stepper motor, or Piezo), compatible with environmental isolation chambers (temperature, pressure, gas phase control) and sealed operation chambers (Glove box). Integrated with automated particle analysis tool ParticleScout™, TrueMatch™ spectral identification library, Python-supported programming interface, and full remote control connectivity.