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Compact Bench-Top Macro Inspection System VEpioneer® MACRO

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Thin Film Analysis LuXpector THEA
Thin Film Analysis LuXpector THEA

Compact Bench-Top Macro Inspection System VEpioneer® MACRO

VEpioneer® MACRO is a hyperspectral vision inspection system for desktop use, fully integrated and operated with just one button. The device provides non-destructive testing capabilities, identifies surface characteristics, detects thin films, and recognizes deviations from production standards at extremely fast scanning speeds.

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  • Field of Study
  • Brand - PVA TePla

Key features


  • Modern Hyperspectral technology: A unique combination of optical spectroscopy and imaging to collect comprehensive sample information in a single run.

  • Fast inspection speed: Optimal measurement time, averaging under 10 seconds per sample, enhancing quality control efficiency.

  • Non-destructive measurement: Conducts surface scanning without damaging the sample, ensuring absolute safety for materials during inspection.

  • Comprehensive analysis: Accurately identifies and maps the thickness of films (from 1 nm to 500 µm) and surface defects.

  • Diverse material compatibility: Flexible measurement capabilities on various substrates such as metals, glass, polymers, semiconductors (Si, SiC), and ceramics.

  • Intelligent control software: Utilizes integrated VEsolve® PRO software, providing in-depth information on the chemical, electrical, and optical properties of the sample.

Detailed description


Technology & Operating Principles 

VEpioneer® MACRO applies advanced hyperspectral vision technology. By combining spectral acquisition and imaging capabilities, the system illuminates the sample surface through broad-spectrum light sources (adjustable halogen, LED, or UV-LED). The device captures reflections from the surface to analyze spectral changes, thereby calculating film thickness and identifying structural anomalies with high spatial resolution.

In industrial production, checking the thickness of thin films and detecting surface defects often requires significant time or complex equipment. VEpioneer® MACRO addresses this issue with an "all-in-one" (bench-top) device, allowing for 100% inspection of sample information in less than 10 seconds. This solution helps manufacturers minimize machine downtime and quickly identify process deviations as they occur.

Integration & Expansion 

Compact design, easy to install on a desktop, supports samples up to 360 x 360 mm. With high customization capabilities and an Ethernet connection interface, the system is ready to meet stringent quality control requirements in both R&D laboratories and modern industrial production environments.

Detailed Specifications


Specification

Value

Supported sample size

Up to 360 x 360 mm, maximum height 10 mm

Measurement technology

Hyperspectral vision

Wavelength range

VNIR: 400-1000 nm; SWIR: 900-1700 nm

Measurement time

< 10 seconds (typical)

Spatial resolution

VNIR 300 µm; SWIR 470 µm

Detection capability

Film thickness (1 nm - 500 µm), defects, contamination

Support materials

Metal, glass, polymer, Si, SiC, ceramic

Control

VEsolve® PRO software

Connection

RJ45 (Ethernet)


Field of Study Materials Sciences or Semiconductor Technology or Quantum Technology or Solar & Lithium Batteries
Brand PVA TePla
PVA_VEpioneer_macro.pdf
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Compact Bench-Top Macro Inspection System VEpioneer® MACRO
Compact Bench-Top Macro Inspection System VEpioneer® MACRO
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