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Thin Film Deposition System  PRO Line PVD 75

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XRF Microscope AttoMap-200
XRF Microscope AttoMap-200
SIMS 7f-Auto Secondary Ion Mass Spectrometer
SIMS 7f-Auto Secondary Ion Mass Spectrometer

Thin Film Deposition System PRO Line PVD 75

The new generation PRO Line PVD 75 thin film deposition system with the capability to handle samples up to 6 inches. The device optimizes ideal base pressure, increases vacuum pumping speed, and supports multiple techniques (Sputtering, E-beam, Thermal). This is a flexible, reliable R&D solution for semiconductor, OLED, and optical technology.
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  • Field of Study
  • Brand - Kurt J. Lesker
  • Sample materials
Kurt J. Lesker
Kurt J. Lesker

A long-standing global manufacturer of ultra-high vacuum (UHV) products and thin film deposition.

Key Features


Smart eKLipse™ Control: Integrated PC-Based HMI interface allows for programming, process control, and intuitive advanced recipe automation.

Flexible box chamber design: Utilizes a 304L stainless steel chamber (100 liters volume) with O-ring sealed side panels, providing maximum modularity and system upgrade capability.

Optional load lock chamber integration: Supports Substrate Load Lock module (on the Open Frame version) for quick sample in/out without venting the entire main chamber.

Multi-source deposition configuration: Allows for flexible combination of up to 6 Torus 3" sputter cathodes, E-beam evaporation source, 4 thermal evaporation sources, or organic LTE source.

Ideal high-temperature processing: Ability to heat the sample stage (maximum size 6") up to 850°C combined with a 100W RF Bias source for pure surface cleaning.

Superior vacuum performance: Achieving an ultra-high base pressure of -5 × 10⁻⁸ Torr thanks to the 1500 l/sec Cryo pump option or high-performance Turbo pump.


Detailed description


 The PRO Line PVD 75 system operates based on the principle of physical vapor deposition (PVD) in an ultra-high vacuum environment. The core point in the mechanism of the system is the flexible integration of multiple energy sources on the same 100-liter box chamber platform.

The system allows for the simultaneous configuration of magnetron sputtering technology using proprietary Torus® cathodes, electron beam (E-beam) evaporation, thermal evaporation, and low-temperature organic material evaporation (LTE). When an inert gas flow (such as Argon) is ionized to create plasma, ions will bombard the target material in the Sputtering mechanism; or a high-intensity electron beam will directly hit the crucible in the E-beam mechanism to vaporize the material. These free material molecules move in the ultra-high vacuum environment of -5 × 10⁻⁸ Torr – where the mean free path is extremely large – to travel straight and adhere tightly to the substrate surface.

To control the quality of the thin film, the system uses a continuous substrate rotation mechanism (up to 20 RPM) combined with quartz crystal microbalance (QCM) thickness controllers. At the same time, the intelligent temperature management system allows heating up to 850°C or direct water cooling, helping to shape the crystal structure of the thin film during the deposition process.

Proprietary eKLipse™ software architecture: Unlike competitors who typically use industrial control software running directly on the Windows operating system that is prone to freezing or interruption, eKLipse™ completely separates the user interface (HMI) from the real-time process controller. If the control computer is turned off or encounters a network issue, the deposition recipes still continue to run automatically and safely, providing absolute protection for expensive research material samples from damage.

Vacuum performance and Optimal geometric design: The design of the square box chamber made of 304L stainless steel optimizes the ratio of volume to internal surface area, combined with removable shields. This allows the system to achieve ultra-high base pressure significantly faster than conventional cylindrical chambers of competitors, minimizing wait times (higher throughput index) and preventing cross-contamination of the base gas.

Compact Dome Shutter design: While other systems use flat sliding shutters that take up a lot of space and are prone to jamming due to material buildup, the PVD 75 employs a curved dome hatch design that hugs the source closely. This solution optimizes the distance from the source to the base, while absolutely preventing cross-contamination between material sources when operating in multilayer mode.

Detailed specifications


Specification

Value

Process Chamber Volume

100 liters

Process Chamber Shape

Rectangular box chamber

Internal dimensions of the chamber (L × W × H)

387.4 × 419.1 × 610 mm (15.25" × 16.50" × 24")

Process Chamber Construction

304L stainless steel

Process Chamber Door

6061 aluminum, hinge type, sealed with O-ring gaskets, front opening

Process Chamber Side panel

2 plates sealed with O-ring gaskets, allowing flexible configuration and easy upgrades

Process Chamber Structure

Stainless steel 304L combined with aluminum 6061 hinge door

Cabinet structure

Carbon steel, fully enclosed equipment support, open chamber area

Material deposition source

Up to 6 sputter cathodes from Torus® 3 inch size

Electron beam (E-beam) vapor source

Standard type 4 material holding positions (4-pocket) with a capacity of 8 cc; optional 8 positions 12 cc or 6 positions 20 cc

Thermal vapor source

Up to 4 4 inch thermal vapor sources

Organic material vapor source

Up to 2 LTE vapor sources

Deposition direction

Sputtering upwards and vaporizing upwards

Base cleaning system

Ion source or substrate bias: eH400 end-Hall, KDC40 grid ion or RF Bias 100 W

Maximum substrate size

01 substrate diameter 150 mm (6 inch)

Substrate rotation system

Variable rotation speed, up to 20 rpm

Substrate heating

Up to 850°C (for 150 mm substrate) or water cooling

Non-standard foot pump

Turbo pump speed 790 liters/second

Base pressure not achieved with Turbo 790 l/s

5 × 10⁻⁷ Torr (6.7 × 10⁻⁷ mbar)

Optional Turbo pump

1250 liters/second

Base pressure not achieved with Turbo 1250 l/s

8 × 10⁻⁸ Torr (1.1 × 10⁻⁷ mbar)

Optional cryo pump

1500 liters/second

Footage not achievable with Cryo Pump

5 × 10⁻⁸ Torr (6.7 × 10⁻⁸ mbar)

Vacuum measurement device

Wide range vacuum gauge

Technology gas supply system

4 channel mass flow control (MFC), combined with a 3-position gate valve or continuous control valve

System control

PC-Based HMI, eKLipseTM advanced recipe control and datalogging

Additional parameters


  • Required power supply (typically, depending on options): 208VAC, 3 phase, 50/60 Hz; Option: 380VAC, 3 phase, 50/60 Hz.
  • Overall dimensions: width 53.5” (1358.9mm) x depth 32” (812.8mm) x height 75.9” (1928mm).
  • Weight: 816 kg.
Field of Study Materials Sciences or Semiconductor Technology
Sample materials Metals & Alloys or Ceramics & Glass or Advanced Materials
Brand Kurt J. Lesker
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Thin Film Deposition System  PRO Line PVD 75
Thin Film Deposition System PRO Line PVD 75
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