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Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro 66ef9f3abd362fe35b2160ef3e89aeb8_medium.webp
Electron Microscopy (SEM & TEM)
Field Emission Scanning Electron Microscopy FESEM | SEM5000Pro
The CIQTEK SEM5000Pro uses advanced Super-Tunnel electronic optical technology to create a beam path without intersection points and employs a combination of electrostatic and electromagnetic lens design. These improvements help reduce space charge effects, minimize lens aberration, and achieve a resolution of 1.2 nm at 1 kV, providing a solution for direct observation of non-conductive or semiconductor samples.
Tabletop Scanning Electron Microscope - NANOS Door-access-zonder-naam-1024x1024.png
Electron Microscopy (SEM & TEM)
Tabletop Scanning Electron Microscope - NANOS

NANOS is designed to be compact and modern, providing high-resolution imaging capabilities (< 8nm) and rapid high-quality elemental analysis with a magnification of 200,000x. NANOS becomes the ideal solution for research, industrial, and environmental applications.

Time-of-Flight ICP-MS Vitesse
Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICPMS-TOF)
Time-of-Flight ICP-MS Vitesse

Vitesse is an Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICP-TOF-MS) system, specifically designed for high-speed multi-element applications such as laser ablation imaging and nanoparticle analysis. It features a segmented reaction cell and powerful interference removal capabilities, making it an ideal solution for geochemical, biological, environmental, and materials research.

XRF Microscope AttoMap-200
3D X-ray Microscopy (XRM)
XRF Microscope AttoMap-200
MicroXRF laboratory achieves the highest resolution with a micron-sized unit (3-5 µm) using high-resolution optics. Sensitivity below ppm for quantification down to parts per million (ppm). Along with Sigray's flexible software packages for energy tuning, maximizing throughput and sensitivity with up to 5 different angled X-ray spectra.  
NanoSIMS 50L nanosims-chondrite.png
Secondary Ion Mass Spectrometry (SIMS)
NanoSIMS 50L
It is an advanced secondary ion mass spectrometer (SIMS), NanoSIMS 50L featuring a proprietary co-axial optical design. The device analyzes isotopes and trace elements at a resolution of <50 nm, ppm sensitivity with parallel acquisition speed. This is a superior analytical solution dedicated to research in geology, cell biology and materials science.
[64223-64218-3290546] TriLambda-30 X-ray Microscope Resolution_TriLambda_interior.webp
3D X-ray Microscopy (XRM)
TriLambda-30 X-ray Microscope

TriLambdaXRM-30 (nanoXRM) utilizes Sigray's proprietary X-ray optics technology to provide cutting-edge resolution of 35nm. The device integrates up to 3 X-ray energy sources simultaneously to optimize the 3D nanoXRM image contrast for all types of materials from polymers to metals, providing a perfect non-destructive sample solution for batteries and biology.

Atomic Force Microscopy Model MFP-3D BIO / Infinity / Origin MFP-3D-Origin-Plus-AFM-Product-Image-compressed-1350x1175.png
Atomic Force Microscopy (AFM)
Atomic Force Microscopy Model MFP-3D BIO / Infinity / Origin
The MFP-3D series from Asylum Research offers versatile AFM systems, from large samples to integrated inverted microscopy. The MFP-3D BIO is a fully integrated AFM with optical microscopy, allowing for simultaneous AFM and fluorescence/phase contrast imaging. The MFP-3D Infinity is the highest performance large sample AFM with a background noise of <20 pm. The MFP-3D Origin/Origin+ is a budget-friendly line that still maintains the quality of Asylum. All support imaging in air and liquid, precise picoNewton force measurements, and dozens of extended modes (PFM, CAFM, KPFM, AM-FM, …).
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