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Minerals & Environment
Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICPMS-TOF)
Time-of-Flight ICP-MS Vitesse

Vitesse is an Inductively Coupled Plasma Time-of-Flight Mass Spectrometry (ICP-TOF-MS) system, specifically designed for high-speed multi-element applications such as laser ablation imaging and nanoparticle analysis. It features a segmented reaction cell and powerful interference removal capabilities, making it an ideal solution for geochemical, biological, environmental, and materials research.

Secondary Ion Mass Spectrometry (SIMS)
Secondary ion mass spectrometry 1300-HR³

Is the generation of Large Geometry SIMS (LG‑SIMS) the most advanced from CAMECA, a device that provides sensitivity and spatial resolution - mass at an absolute level. This is the optimal cost-effective analytical solution for geochemical research, trace element measurement, mineral dating, and analysis of microparticles for nuclear safeguards.

Secondary Ion Mass Spectrometry (SIMS)
IMS 7f-GEO

Is a secondary ion mass spectrometer IMS 7f-GEO specialized from CAMECA, integrating a dual detector (FC/FC) and Electron Multiplier. The device offers an ultra-fast peak switching speed of 0.3s, reducing measurement time from >3000s to 56s. This is the optimal High-throughput solution for analyzing stable isotopes and rare earth elements (REE) in geochemistry.

3D X-ray Microscopy (XRM)
TriLambda-30 X-ray Microscope

TriLambdaXRM-30 (nanoXRM) utilizes Sigray's proprietary X-ray optics technology to provide cutting-edge resolution of 35nm. The device integrates up to 3 X-ray energy sources simultaneously to optimize the 3D nanoXRM image contrast for all types of materials from polymers to metals, providing a perfect non-destructive sample solution for batteries and biology.

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