Key Features
- Revolutionary Technology: Overcoming the ultra-high vacuum (UHV) barrier of traditional XPS systems, allowing for chemical surface analysis at high pressures far above UHV (up to hundreds of mbar).
- High Throughput Analysis: Providing the shortest loading-to-measurement time for all types of samples, supporting continuous automated operation with the AutoLoader robot.
- Controllable Atmosphere: Maintaining and adjusting a stable atmosphere from sample loading through the entire analysis process via dedicated sample environment modules.
- Environmental Charge Compensation: Using low-energy ions and electrons generated from the gas molecule ionization process by X-rays to automatically neutralize charge, enabling accurate analysis of insulating samples without the need for auxiliary equipment.
- Ergonomic All-in-one Design (Optimized all-in-one design): Integrating the entire power supply system, controller, electrical cabinet, and closed-cycle water cooling system in a single compact installation footprint.
- Fully Software Controlled (Fully software controlled): Fully automating the vacuum system, gas supply, and analytical components, continuously logging system parameters (data logging) and supporting remote operation.
Detailed description
- Technology/Principle: EnviroESCA operates based on the principle of the photoelectric effect. The device uses a monochromatic AlKalpha micro-focused X-ray source to excite electrons from the sample surface, which are then collected by a hemispherical analyzer combined with a differentially pumped lens system to determine the chemical composition. Thanks to the advanced gas and vacuum management system, the device can operate stably in the near ambient pressure (NAP) range.
- Highlights: Traditional ESCA/XPS systems must operate in ultra-high vacuum (UHV) environments, making the analysis of vacuum-incompatible samples such as liquids, polymers, biological samples, or in operando reactions of batteries and catalysts impossible. EnviroESCA completely addresses this issue by allowing direct measurement in pressure and humidity environments, entirely eliminating the need for complex sample pretreatment.
- Integration/Expansion: The system features a smart modular design with the SampleExplorer ex situ sample preparation device. Users can integrate additional advanced options such as: a scannable small spot ion source or a gas cluster ion source for sputter depth profiling; the SmartDock sample loading chamber connecting to the GloveBox system; and the HPC 20 high-pressure reaction chamber.