Skip to Content
Thin film spectrometer for ophthalmic lenses ETA-ARC

Price:

0 ₫

Offline multi-purpose transmittance and color spectrometer ETA-CSS
Offline multi-purpose transmittance and color spectrometer ETA-CSS
Inline multi-purpose spectrometer ETA-TCM
Inline multi-purpose spectrometer ETA-TCM

Thin film spectrometer for ophthalmic lenses ETA-ARC

With proprietary back reflection cancellation technology, NXT's ETA-ARC lens coating measurement system is the optimal solution for quality inspection of eyewear. The device quickly measures excess reflection, color, and thickness of hard coatings (0.1–20 µm) in less than 0.2 seconds without the need for roughening or black coating the back, helping to preserve the integrity of the sample being measured.
2 people are viewing this right now
0 ₫ 0 ₫

  • Field of Study
  • Brand - NXT GmbH
NXT GmbH
NXT GmbH

Manufacturer of Reflective Technology Coating Thickness Spectroscopy

Key features


  • Back reflection cancellation: Completely eliminates noise from the back for samples thicker than or equal to 2 mm without the need for roughening or black coating, helping to preserve the sample for commercialization after measurement.
  • Simultaneous measurement of two hard coatings: The specialized ETA-STC software allows for the simultaneous measurement of the thickness of 2 layers (such as Primer + Hard coating or UV + IPL) in less than 1 second.
  • Optimal analysis speed: Typical measurement time is under 0.2 seconds for each measurement, supporting increased productivity and meeting the demand for high-volume sample inspection (QA/QC).
  • Integrated converging sensor and tilt: Automatically adjusts the angle of light reflection reception regardless of the curvature of the lens, ensuring the highest optical accuracy.
  • Wide spectral analysis range: Accurately measures reflection spectra in the wavelength range of 380 – 1050 nm and film thickness from 0.1 to 20 µm with extremely low error of ± 0.04 µm.

Detailed description


Non-destructive reflection spectral technology

ETA-ARC integrates Silicon current sensors with a Tungsten Halogen light source (3000 K), accurately recording the reflectance spectrum in the wavelength range from 380 to 1050 nm. The proprietary probe head integrates intelligent focus and tilt sensors, automatically optimizing the angle of light reception. This ensures the accuracy of optical measurements regardless of the profile or complex curvature of different types of eyeglass lenses.

Direct measurement without the need for back sample processing

In traditional quality assurance (QA/QC) processes, measuring thin films on transparent materials often requires roughening or painting the back black to eliminate reflection noise, completely damaging the test sample. ETA-ARC thoroughly addresses this barrier with a smart probe that completely eliminates back reflection on substrates thicker than or equal to 2 mm. Businesses can perform non-destructive testing directly on finished products, increasing the QA sampling rate to 100% without material loss.

Dedicated management software ETA-STC

The system operates on a powerful ETA-STC software platform, supporting simultaneous measurement of two coatings (such as Primer + Hard coating or UV + IPL) in one measurement cycle. The intuitive interface comes with built-in calibration tools, automatic data collection, and evaluation. All analysis results are stored and exported flexibly, greatly assisting in traceability as well as continuous improvement of the production process.

Detailed specifications


Thickness range / Accuracy

0.1 – 20 µm / ± 0.04 µm

Color measurementCIE
Detector

Silicon current sensor

Spectral range380 – 1050 nm
Optical resolution5.2 nm
Wavelength accuracy± 0.5 nm
Typical measurement time≤ 0.2 s
Light source

Tungsten Halogen (3000 K)

Digitization16-bit
Field of Study Materials Sciences
Brand NXT GmbH
ETA-ARC_Product_Note_V5_compressed.pdf
Download
Thin film spectrometer for ophthalmic lenses ETA-ARC
Thin film spectrometer for ophthalmic lenses ETA-ARC
0 ₫