Key features
- Integrated integrating sphere and light source: Allows for accurate measurements in the wide spectral range of 380–1070 nm (with optional extension 360–1700 nm), ensuring long-term stable light source thanks to the internal calibration channel.
- Superior distance and tilt tolerance: Accepts sample distance deviations of up to ±5 mm and tilt angles of ±2°, enabling accurate measurements even on samples that are sagging or experiencing strong vibrations during the roll-to-roll process.
- Flexible modular design (LITE, LAB, SCAN, INLINE): Meets diverse needs from fixed table measurements in the laboratory (R&D) to automated motorized scanning or direct monitoring on the production line (QC).
- Extremely fast measurement and analysis speed: Captures spectra in less than 0.1 seconds per point combined with intelligent computational algorithms, allowing for real-time assessment of thin film thickness (5nm - 20µm) and n&k constants.
- High optical accuracy (<0.4%): Minimizes measurement errors for color spectra and multilayer films, providing reliable data to improve vacuum thin film deposition processes (CVD, PVD) and wet films.
Detailed description
Advanced reflectance and transmittance spectroscopy technology
Metis determines the thickness and optical constants n&k of thin films based on the phenomenon of spectral interference. Integrating a smart integrating sphere, the device measures both reflection and transmission spectra in less than 100 ms. The system maintains long-term stability thanks to an internal calibration channel, achieving optical accuracy <0.4% (400–1000 nm).
Accurate measurement on moving and curved surfaces
For roll-to-roll (R2R) or large format glass, the phenomenon of vibration and sample bending often causes significant errors for conventional measuring devices. Metis overcomes this barrier with extremely large positioning tolerances: allowing distance fluctuations of up to ±5 mm and tilt angles of ±2° without reducing accuracy, helping to control the quality of the film directly on the moving conveyor.
Customizability and flexible system integration
The system offers a variety of configurations from LITE (fixed sample table), LAB (moving sample table), SCAN (automated mapping) to INLINE (direct measurement on the production line). Metis supports upgrading to an extended spectral range (360–1700 nm), integrating multiple measuring heads simultaneously and communicating directly with the factory PLC, optimizing the vacuum coating or wet coating process.