Key features
The product catalog of SPECS has been expanded with a range of ProvenX XPS spectrometer systems, representing the pinnacle of our broad knowledge in the development and production of complete systems for analysis that meet the most stringent scientific requirements. ProvenX includes a range of specialized XPS for ARPES, µ-ARPES, and Momentum Microscopy, XPS/UPS as well as NAP-XPS.
- Reliable technology platform: The ProvenX system line has been developed based on SPECS' long-standing experience in manufacturing high-performance surface analysis systems.
- Performance optimization: The design philosophy of the system is a combination of the most essential analytical techniques with advanced, proven technology to achieve peak performance.
Detailed description
ProvenX: An elite system from the extensive experience of the SPECS group
A basic ProvenX features a compact, fixed system layout but offers highly flexible choices of analytical components, such as a hemispherical electron energy analyzer, X-ray sources, UV sources, ion sources, electron guns, and more. Since the ProvenX system series compiles everything we have built so far, effectively tested system specifications, system drawings, factory acceptance testing, as well as site and installation requirements are already completely available. It is a multi-functional, multi-technology system that is genuinely easy to install and operate.
Core hardware configuration of ProvenX-PS
- Dedicated system: ProvenX-PS is a dedicated system for measuring X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS).
- PHOIBOS 150 electron analyzer: Equipped with a 128-channel ultra-fast delay-line detector, integrated with snapshot capability.
- Monochromated X-ray source: Uses the FOCUS 500 dual anode monochromated X-ray source.
- High-performance UV source (Optional): Can additionally integrate a high-intensity UVS 10 UV source.
Vacuum chamber and Sample pre-treatment
- Clean sample storage: The system comes with a sample storage unit in ultra-high vacuum (UHV) ultra-clean environment.
- Quick sample loading chamber (Loadlock): Supports fast simultaneous loading of multiple samples.
Upgrade expandability:
- Can be equipped with an additional dedicated sample preparation chamber.
- Optional integration of a high pressure cell HPC 20.
Control system and Software
- SpecsLab Prodigy software: Controls the entire system through the SpecsLab Prodigy software suite, with built-in remote control packages.
- Operational automation: Supports automatic sample handling and movement mechanisms.
- Vacuum management: The vacuum management and control system is digitized, fully computer-controlled.
Peripheral devices and Additional options
- Small spot X-ray source: Optional integration for applications requiring in-depth material property analysis.
- Charge compensation/neutralization sources: Supports integration of ion sources, electron sources, and charge neutralization sources.
- Extension: Ready to provide additional specialized software and other sample preparation tools according to research needs.
ProvenX DeviSim NAP system for modern XPS and UPS analysis under near ambient pressure (NAP) conditions