Main features
- High-resolution imaging at low acceleration voltage.
- High-pressure tunneling technology “SuperTunnel” ensures resolution at low voltage.
- Electromagnetic & electrostatic combined lens helps improve resolution at low voltage and allows observation of magnetic samples.
- The electron optical path without intersection points reduces system aberration and improves resolution.
- The objective lens is water-cooled and maintains a constant temperature ensuring stability, reliability, and repeatability during lens operation.
- Variable multi-hole aperture, integrated with an electromagnetic beam steering system allows automatic aperture switching, no mechanical adjustment needed, and enables quick switching between observation modes.
Detailed description
Technology & Principles:
CIQTEK SEM5000Pro is a device that operates based on the principle of converging high-density electron beams and analyzing non-destructive surface interactions. The core feature is the integration of advanced Super-Tunnel optical electronic technology combined with an electromagnetic-static lens design. The electron beam travels along an optical trajectory without intersections, allowing for the extraction of detailed image information of materials with extremely high sharpness without damaging sensitive sample structures.
Super-Tunnel optical technology:
Completely resolves the phenomenon of blurred or out-of-focus images when lowering the acceleration voltage (by maintaining high beam energy throughout the column journey and only decelerating just before contacting the sample), achieving a resolution of 0.8 nm @15 kV, SE and 1.2 nm @ 1.0 kV, SE.
Electron path without intersections:
Thoroughly addresses distortion errors caused by space charge accumulation effects on traditional transmission paths through a non-intersecting trajectory design, helping to minimize system aberrations.
Direct observation capability at low voltage:
Eliminates strong radiation barriers that damage the structures of sensitive biological, polymer... samples to the beam thanks to a flexible acceleration voltage range from 20V to 30 kV, allowing for non-destructive sample analysis.
Integration, expansion:
Integrates automatic brightness and contrast adjustment, automatic focusing, and automatic image denoising.